Ohtsu K. Model-Based Monitoring and Statistical Control 202410.47 MB
Progress in Nano-Electro-Optics VI - Nano-Optical Probing, Manipulation, Analysis, and Their Theoretical Bases - M. Ohtsu (Springer, 2008).pdf5.84 MB
Progress in Nano-Electro Optics IV - Characterization of Nano-Optical Materials and Optical Near-Field Interactions - M. Ohtsu (Springer, 2005).pdf5.03 MB